@INPROCEEDINGS{Kerber2009_1,
  AUTHOR    = {Kerber, Jens and Tevs, Art and Zayer, Rhaleb and Belyaev, Alexander and Seidel, Hans-Peter},
  TITLE     = {Feature Sensitive Bas Relief Generation},
  BOOKTITLE = {IEEE International Conference on Shape Modeling and Applications Proceedings},
  PUBLISHER = {IEEE Computer Society Press},
  ADDRESS   = {Beijing, China},
  PAGES     = {148--154},
  YEAR      = {2009},
  MONTH     = {June},
  ISBN      = {978-1-4244-4068-9},
}