“MEt3R: Measuring Multi-View Consistency in Generated Images,” in IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2025), Nashville, TN, USA, 2025.
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BibTeX
@inproceedings{Asim_CVPR25,
TITLE = {{MEt3R}: {M}easuring Multi-View Consistency in Generated Images},
AUTHOR = {Asim, Mohammad and Wewer, Christopher and Wimmer, Thomas and Schiele, Bernt and Lenssen, Jan Eric},
LANGUAGE = {eng},
ISBN = {979-8-3315-4364-8},
DOI = {10.1109/CVPR52734.2025.00566},
PUBLISHER = {IEEE},
YEAR = {2025},
MARGINALMARK = {$\bullet$},
DATE = {2025},
BOOKTITLE = {IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2025)},
PAGES = {6034--6044},
ADDRESS = {Nashville, TN, USA},
}Endnote
%0 Conference Proceedings %A Asim, Mohammad %A Wewer, Christopher %A Wimmer, Thomas %A Schiele, Bernt %A Lenssen, Jan Eric %+ Computer Vision and Machine Learning, MPI for Informatics, Max Planck Society Computer Vision and Machine Learning, MPI for Informatics, Max Planck Society Computer Vision and Machine Learning, MPI for Informatics, Max Planck Society Computer Vision and Machine Learning, MPI for Informatics, Max Planck Society Computer Vision and Machine Learning, MPI for Informatics, Max Planck Society %T MEt3R: Measuring Multi-View Consistency in Generated Images : %G eng %U http://hdl.handle.net/21.11116/0000-0010-7934-C %R 10.1109/CVPR52734.2025.00566 %D 2025 %B IEEE/CVF Conference on Computer Vision and Pattern Recognition %Z date of event: 2025-06-11 - 2025-06-15 %C Nashville, TN, USA %B IEEE/CVF Conference on Computer Vision and Pattern Recognition %P 6034 - 6044 %I IEEE %@ 979-8-3315-4364-8